An analytical model for spectral peak frequency prediction of substrate noise in CMOS substrates

Ming Shen, Jan H. Mikkelsen. An analytical model for spectral peak frequency prediction of substrate noise in CMOS substrates. In 2013 NORCHIP, Vilnius, Lithuania, November 11-12, 2013. pages 1-4, IEEE, 2013. [doi]

Abstract

Abstract is missing.