Hao Shen, Lance Shen, Pierce Xu, Wu Yang, Junna Zhong. Application of Data Mining Based Scan Diagnosis Yield Analysis in a Foundry and Fabless Working Environment. In 25th IEEE Asian Test Symposium, ATS 2016, Hiroshima, Japan, November 21-24, 2016. pages 128, IEEE Computer Society, 2016. [doi]
@inproceedings{ShenSXYZ16,
title = {Application of Data Mining Based Scan Diagnosis Yield Analysis in a Foundry and Fabless Working Environment},
author = {Hao Shen and Lance Shen and Pierce Xu and Wu Yang and Junna Zhong},
year = {2016},
doi = {10.1109/ATS.2016.66},
url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2016.66},
researchr = {https://researchr.org/publication/ShenSXYZ16},
cites = {0},
citedby = {0},
pages = {128},
booktitle = {25th IEEE Asian Test Symposium, ATS 2016, Hiroshima, Japan, November 21-24, 2016},
publisher = {IEEE Computer Society},
isbn = {978-1-5090-3809-1},
}