Hao Shen, Lance Shen, Pierce Xu, Wu Yang, Junna Zhong. Application of Data Mining Based Scan Diagnosis Yield Analysis in a Foundry and Fabless Working Environment. In 25th IEEE Asian Test Symposium, ATS 2016, Hiroshima, Japan, November 21-24, 2016. pages 128, IEEE Computer Society, 2016. [doi]
Abstract is missing.