Ruijing Shen, Sheldon X.-D. Tan, Ning Mi, Yici Cai. Statistical modeling and analysis of chip-level leakage power by spectral stochastic method. Integration, 43(1):156-165, 2010. [doi]
@article{ShenTMC10,
title = {Statistical modeling and analysis of chip-level leakage power by spectral stochastic method},
author = {Ruijing Shen and Sheldon X.-D. Tan and Ning Mi and Yici Cai},
year = {2010},
doi = {10.1016/j.vlsi.2009.09.003},
url = {http://dx.doi.org/10.1016/j.vlsi.2009.09.003},
tags = {modeling, analysis},
researchr = {https://researchr.org/publication/ShenTMC10},
cites = {0},
citedby = {0},
journal = {Integration},
volume = {43},
number = {1},
pages = {156-165},
}