Fast Statistical Full-Chip Leakage Analysis for Nanometer VLSI Systems - researchr publication authors

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Ruijing Shen, Sheldon X.-D. Tan, Hai Wang, Jinjun Xiong. Fast Statistical Full-Chip Leakage Analysis for Nanometer VLSI Systems. ACM Trans. Design Autom. Electr. Syst., 17(4):51, 2012. [doi]

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