Ruijing Shen, Sheldon X.-D. Tan, Hai Wang, Jinjun Xiong. Fast Statistical Full-Chip Leakage Analysis for Nanometer VLSI Systems. ACM Trans. Design Autom. Electr. Syst., 17(4):51, 2012. [doi]
@article{ShenTWX12,
title = {Fast Statistical Full-Chip Leakage Analysis for Nanometer VLSI Systems},
author = {Ruijing Shen and Sheldon X.-D. Tan and Hai Wang and Jinjun Xiong},
year = {2012},
doi = {10.1145/2348839.2348855},
url = {http://doi.acm.org/10.1145/2348839.2348855},
researchr = {https://researchr.org/publication/ShenTWX12},
cites = {0},
citedby = {0},
journal = {ACM Trans. Design Autom. Electr. Syst.},
volume = {17},
number = {4},
pages = {51},
}