Zilong Shen, Yize Wang, Yunhao Li, Xing Zhang 0002, Yuan Wang 0001. A Scalable Model for Snapback Characteristics of Circuit-Level ESD Simulation. IEEE Trans. Circuits Syst. II Express Briefs, 69(3):1547-1551, 2022. [doi]
@article{ShenWLZW22,
title = {A Scalable Model for Snapback Characteristics of Circuit-Level ESD Simulation},
author = {Zilong Shen and Yize Wang and Yunhao Li and Xing Zhang 0002 and Yuan Wang 0001},
year = {2022},
doi = {10.1109/TCSII.2021.3123838},
url = {https://doi.org/10.1109/TCSII.2021.3123838},
researchr = {https://researchr.org/publication/ShenWLZW22},
cites = {0},
citedby = {0},
journal = {IEEE Trans. Circuits Syst. II Express Briefs},
volume = {69},
number = {3},
pages = {1547-1551},
}