A Scalable Model for Snapback Characteristics of Circuit-Level ESD Simulation

Zilong Shen, Yize Wang, Yunhao Li, Xing Zhang 0002, Yuan Wang 0001. A Scalable Model for Snapback Characteristics of Circuit-Level ESD Simulation. IEEE Trans. Circuits Syst. II Express Briefs, 69(3):1547-1551, 2022. [doi]

Abstract

Abstract is missing.