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ACF-COG interconnection conductivity inspection system using conductive area

Xinjun Sheng, Lei Jia, Zhenhua Xiong, Zhiping Wang, Han Ding. ACF-COG interconnection conductivity inspection system using conductive area. Microelectronics Reliability, 53(4):622-628, 2013. [doi]

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Xinjun Sheng

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Lei Jia

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Zhenhua Xiong

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Zhiping Wang

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Han Ding

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