Improved wafer map defect pattern classification using automatic data augmentation based lightweight encoder network in contrastive learning - researchr publication

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Yi-sheng, Jinda Yan, Minghao Piao. Improved wafer map defect pattern classification using automatic data augmentation based lightweight encoder network in contrastive learning. J. Intelligent Manufacturing, 36(6):4129-4141, August 2025. [doi]

Abstract is missing.

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