Static noise analysis for digital integrated circuits in partially-depleted silicon-on-insulator technology

Kenneth L. Shepard, Dae-Jin Kim. Static noise analysis for digital integrated circuits in partially-depleted silicon-on-insulator technology. In DAC. pages 239-242, 2000. [doi]

@inproceedings{ShepardK00,
  title = {Static noise analysis for digital integrated circuits in partially-depleted silicon-on-insulator technology},
  author = {Kenneth L. Shepard and Dae-Jin Kim},
  year = {2000},
  doi = {10.1145/337292.337403},
  url = {http://doi.acm.org/10.1145/337292.337403},
  tags = {analysis, static analysis},
  researchr = {https://researchr.org/publication/ShepardK00},
  cites = {0},
  citedby = {0},
  pages = {239-242},
  booktitle = {DAC},
}