An experimental and analytical method to observe the polysilicon Nanowire mosfet threshold voltage

Gene Sheu, Shao-Ming Yang, Aanand, Syed Sarwar Imam, Ming-Jen Fan, Shao-Wei Lu. An experimental and analytical method to observe the polysilicon Nanowire mosfet threshold voltage. In 11th IEEE Annual International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2016, Sendai, Japan, April 17-20, 2016. pages 121-124, IEEE, 2016. [doi]

Abstract

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