Detecting Clusters and Outliers for Multi-dimensional Data

Yong Shi. Detecting Clusters and Outliers for Multi-dimensional Data. In 2008 International Conference on Multimedia and Ubiquitous Engineering (MUE 2008), 24-26 April 2008, Busan, Korea. pages 429-432, IEEE Computer Society, 2008. [doi]

Abstract

Abstract is missing.