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Exploiting Process Variation for Write Performance Improvement on NAND Flash Memory Storage Systems

Liang Shi, Yejia Di, Mengying Zhao, Chun Jason Xue, Kaijie Wu, Edwin Hsing-Mean Sha. Exploiting Process Variation for Write Performance Improvement on NAND Flash Memory Storage Systems. IEEE Trans. VLSI Syst., 24(1):334-337, 2016. [doi]

Authors

Liang Shi

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Yejia Di

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Mengying Zhao

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Chun Jason Xue

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Kaijie Wu

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Edwin Hsing-Mean Sha

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