Haochen Shi, Zhiyuan Jin, Wenjing Tang, Jing Wang, Kai Jiang, Mingsheng Xu, Wei Xia, Xiangang Xu. High-performance one-stage detector for SiC crystal defects based on convolutional neural network. Knowl.-Based Syst., 280:110994, November 2023. [doi]
Abstract is missing.