Lei Shi, Masanari Kondo, Naoyasu Ubayashi, Yasutaka Kamei. Towards Better Coverage of Dataset with Software Product Line Engineering. In 21st IEEE International Conference on Software Quality, Reliability and Security, QRS 2021 - Companion, Hainan, China, December 6-10, 2021. pages 1173-1174, IEEE, 2021. [doi]
Abstract is missing.