Zhengyuan Shi, Min Li, Sadaf Khan, Liuzheng Wang, Naixing Wang, Yu Huang, Qiang Xu 0001. DeepTPI: Test Point Insertion with Deep Reinforcement Learning. In IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022. pages 194-203, IEEE, 2022. [doi]
@inproceedings{ShiLKWWH022,
title = {DeepTPI: Test Point Insertion with Deep Reinforcement Learning},
author = {Zhengyuan Shi and Min Li and Sadaf Khan and Liuzheng Wang and Naixing Wang and Yu Huang and Qiang Xu 0001},
year = {2022},
doi = {10.1109/ITC50671.2022.00027},
url = {https://doi.org/10.1109/ITC50671.2022.00027},
researchr = {https://researchr.org/publication/ShiLKWWH022},
cites = {0},
citedby = {0},
pages = {194-203},
booktitle = {IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022},
publisher = {IEEE},
isbn = {978-1-6654-6270-9},
}