Juntai Shi, Wei Su, Lei Liu, Shenglin Xu, Tianyuan Huang, Jiamin Liu, Wenli Yue, Shihua Li. A Deep Memory-Aware Attentive Model for Knowledge Tracing. In Jihe Wang, Yi He 0007, Thang N. Dinh, Christan Grant, Meikang Qiu, Witold Pedrycz, editors, IEEE International Conference on Data Mining, ICDM 2023 - Workshops, Shanghai, China, December 4, 2023. pages 1581-1590, IEEE, 2023. [doi]
Abstract is missing.