Selective Low-Care Coding: A Means for Test Data Compression in Circuits with Multiple Scan Chains - researchr publication authors

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Youhua Shi, Nozomu Togawa, Shinji Kimura, Masao Yanagisawa, Tatsuo Ohtsuki. Selective Low-Care Coding: A Means for Test Data Compression in Circuits with Multiple Scan Chains. IEICE Transactions, 89-A(4):996-1004, 2006. [doi]

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