Selective Low-Care Coding: A Means for Test Data Compression in Circuits with Multiple Scan Chains

Youhua Shi, Nozomu Togawa, Shinji Kimura, Masao Yanagisawa, Tatsuo Ohtsuki. Selective Low-Care Coding: A Means for Test Data Compression in Circuits with Multiple Scan Chains. IEICE Transactions, 89-A(4):996-1004, 2006. [doi]

Abstract

Abstract is missing.