Identifying Reliability High-Correlated Gates of Logic Circuits With Pearson Correlation Coefficient - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Zhanhui Shi, Jie Xiao 0003, Jianhui Jiang, Ying Zhang 0040, Yuhao Zhou. Identifying Reliability High-Correlated Gates of Logic Circuits With Pearson Correlation Coefficient. IEEE Trans. Circuits Syst. II Express Briefs, 71(4):2319-2323, April 2024. [doi]

This author has not been identified. Look up 'Zhanhui Shi' in GoogleThis author has not been identified. Look up 'Jie Xiao 0003' in GoogleThis author has not been identified. Look up 'Jianhui Jiang' in GoogleThis author has not been identified. Look up 'Ying Zhang 0040' in GoogleThis author has not been identified. Look up 'Yuhao Zhou' in Google

runs on WebDSL