Identifying Reliability High-Correlated Gates of Logic Circuits With Pearson Correlation Coefficient

Zhanhui Shi, Jie Xiao 0003, Jianhui Jiang, Ying Zhang 0040, Yuhao Zhou. Identifying Reliability High-Correlated Gates of Logic Circuits With Pearson Correlation Coefficient. IEEE Trans. Circuits Syst. II Express Briefs, 71(4):2319-2323, April 2024. [doi]

Abstract

Abstract is missing.