Effective Steganalysis Based on Statistical Moments of Wavelet Characteristic Function

Yun Q. Shi, Guorong Xuan, Chengyun Yang, Jianjiong Gao, Zhenping Zhang, Peiqi Chai, Dekun Zou, Chunhua Chen, Wen Chen. Effective Steganalysis Based on Statistical Moments of Wavelet Characteristic Function. In International Symposium on Information Technology: Coding and Computing (ITCC 2005), Volume 1, 4-6 April 2005, Las Vegas, Nevada, USA. pages 768-773, IEEE Computer Society, 2005. [doi]

Authors

Yun Q. Shi

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Guorong Xuan

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Chengyun Yang

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Jianjiong Gao

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Zhenping Zhang

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Peiqi Chai

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Dekun Zou

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Chunhua Chen

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Wen Chen

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