Effective Steganalysis Based on Statistical Moments of Wavelet Characteristic Function

Yun Q. Shi, Guorong Xuan, Chengyun Yang, Jianjiong Gao, Zhenping Zhang, Peiqi Chai, Dekun Zou, Chunhua Chen, Wen Chen. Effective Steganalysis Based on Statistical Moments of Wavelet Characteristic Function. In International Symposium on Information Technology: Coding and Computing (ITCC 2005), Volume 1, 4-6 April 2005, Las Vegas, Nevada, USA. pages 768-773, IEEE Computer Society, 2005. [doi]

@inproceedings{ShiXYGZCZCC05,
  title = {Effective Steganalysis Based on Statistical Moments of Wavelet Characteristic Function},
  author = {Yun Q. Shi and Guorong Xuan and Chengyun Yang and Jianjiong Gao and Zhenping Zhang and Peiqi Chai and Dekun Zou and Chunhua Chen and Wen Chen},
  year = {2005},
  doi = {10.1109/ITCC.2005.138},
  url = {http://dx.doi.org/10.1109/ITCC.2005.138},
  tags = {rule-based},
  researchr = {https://researchr.org/publication/ShiXYGZCZCC05},
  cites = {0},
  citedby = {0},
  pages = {768-773},
  booktitle = {International Symposium on Information Technology: Coding and Computing (ITCC 2005), Volume 1, 4-6 April 2005, Las Vegas, Nevada, USA},
  publisher = {IEEE Computer Society},
}