Yukiko Shibasaki, Koji Asami, Anna Kuwana, Kosuke Machida, Yuanyang Du, Akemi Hatta, Kazuyoshi Kubo, Haruo Kobayashi. Crest Factor Controlled Multi-Tone Signals for Analog/Mixed-Signal IC Testing. In IEEE International Test Conference in Asia, ITC-Asia 2019, Tokyo, Japan, September 3-5, 2019. pages 7-12, IEEE, 2019. [doi]
@inproceedings{ShibasakiAKMDHK19,
title = {Crest Factor Controlled Multi-Tone Signals for Analog/Mixed-Signal IC Testing},
author = {Yukiko Shibasaki and Koji Asami and Anna Kuwana and Kosuke Machida and Yuanyang Du and Akemi Hatta and Kazuyoshi Kubo and Haruo Kobayashi},
year = {2019},
doi = {10.1109/ITC-Asia.2019.00015},
url = {https://doi.org/10.1109/ITC-Asia.2019.00015},
researchr = {https://researchr.org/publication/ShibasakiAKMDHK19},
cites = {0},
citedby = {0},
pages = {7-12},
booktitle = {IEEE International Test Conference in Asia, ITC-Asia 2019, Tokyo, Japan, September 3-5, 2019},
publisher = {IEEE},
isbn = {978-1-7281-4718-5},
}