Yukiko Shibasaki, Koji Asami, Anna Kuwana, Kosuke Machida, Yuanyang Du, Akemi Hatta, Kazuyoshi Kubo, Haruo Kobayashi. Crest Factor Controlled Multi-Tone Signals for Analog/Mixed-Signal IC Testing. In IEEE International Test Conference in Asia, ITC-Asia 2019, Tokyo, Japan, September 3-5, 2019. pages 7-12, IEEE, 2019. [doi]
Abstract is missing.