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Laser speckle photography for surface tampering detection

Yi-Chang Shih, Abe Davis, Samuel W. Hasinoff, Frédo Durand, William T. Freeman. Laser speckle photography for surface tampering detection. In 2012 IEEE Conference on Computer Vision and Pattern Recognition, Providence, RI, USA, June 16-21, 2012. pages 33-40, IEEE, 2012. [doi]

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Yi-Chang Shih

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Abe Davis

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Samuel W. Hasinoff

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Frédo Durand

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William T. Freeman

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