Yi-Chang Shih, Abe Davis, Samuel W. Hasinoff, Frédo Durand, William T. Freeman. Laser speckle photography for surface tampering detection. In 2012 IEEE Conference on Computer Vision and Pattern Recognition, Providence, RI, USA, June 16-21, 2012. pages 33-40, IEEE, 2012. [doi]
@inproceedings{ShihDHDF12,
title = {Laser speckle photography for surface tampering detection},
author = {Yi-Chang Shih and Abe Davis and Samuel W. Hasinoff and Frédo Durand and William T. Freeman},
year = {2012},
doi = {10.1109/CVPR.2012.6247655},
url = {http://doi.ieeecomputersociety.org/10.1109/CVPR.2012.6247655},
researchr = {https://researchr.org/publication/ShihDHDF12},
cites = {0},
citedby = {0},
pages = {33-40},
booktitle = {2012 IEEE Conference on Computer Vision and Pattern Recognition, Providence, RI, USA, June 16-21, 2012},
publisher = {IEEE},
isbn = {978-1-4673-1226-4},
}