Kyu-Nam Shim, Jiang Hu. Transient and fine-grained voltage adaptation for variation resilience in VLSI interconnects. In Proceedings of the 12th International Symposium on Quality Electronic Design, ISQED 2011, Santa Clara, California, USA, 14-16 March 2011. pages 80-86, IEEE, 2011. [doi]
@inproceedings{ShimH11,
title = {Transient and fine-grained voltage adaptation for variation resilience in VLSI interconnects},
author = {Kyu-Nam Shim and Jiang Hu},
year = {2011},
doi = {10.1109/ISQED.2011.5770707},
url = {http://dx.doi.org/10.1109/ISQED.2011.5770707},
researchr = {https://researchr.org/publication/ShimH11},
cites = {0},
citedby = {0},
pages = {80-86},
booktitle = {Proceedings of the 12th International Symposium on Quality Electronic Design, ISQED 2011, Santa Clara, California, USA, 14-16 March 2011},
publisher = {IEEE},
isbn = {978-1-61284-914-0},
}