Yoshihiro Shima, Seiji Kashioka, Toshikazu Yasue. Defect detection method for stamped patterns utilizing random access parallel matching technique. Systems and Computers in Japan, 18(1):79-90, 1987. [doi]
@article{ShimaKY87,
title = {Defect detection method for stamped patterns utilizing random access parallel matching technique},
author = {Yoshihiro Shima and Seiji Kashioka and Toshikazu Yasue},
year = {1987},
doi = {10.1002/scj.4690180108},
url = {http://dx.doi.org/10.1002/scj.4690180108},
researchr = {https://researchr.org/publication/ShimaKY87},
cites = {0},
citedby = {0},
journal = {Systems and Computers in Japan},
volume = {18},
number = {1},
pages = {79-90},
}