Metric Learning with Background Noise Class for Few-Shot Detection of Rare Sound Events

Kazuki Shimada, Yuichiro Koyama, Akira Inoue. Metric Learning with Background Noise Class for Few-Shot Detection of Rare Sound Events. In 2020 IEEE International Conference on Acoustics, Speech and Signal Processing, ICASSP 2020, Barcelona, Spain, May 4-8, 2020. pages 616-620, IEEE, 2020. [doi]

Authors

Kazuki Shimada

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Yuichiro Koyama

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Akira Inoue

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