Metric Learning with Background Noise Class for Few-Shot Detection of Rare Sound Events

Kazuki Shimada, Yuichiro Koyama, Akira Inoue. Metric Learning with Background Noise Class for Few-Shot Detection of Rare Sound Events. In 2020 IEEE International Conference on Acoustics, Speech and Signal Processing, ICASSP 2020, Barcelona, Spain, May 4-8, 2020. pages 616-620, IEEE, 2020. [doi]

@inproceedings{ShimadaKI20,
  title = {Metric Learning with Background Noise Class for Few-Shot Detection of Rare Sound Events},
  author = {Kazuki Shimada and Yuichiro Koyama and Akira Inoue},
  year = {2020},
  doi = {10.1109/ICASSP40776.2020.9054712},
  url = {https://doi.org/10.1109/ICASSP40776.2020.9054712},
  researchr = {https://researchr.org/publication/ShimadaKI20},
  cites = {0},
  citedby = {0},
  pages = {616-620},
  booktitle = {2020 IEEE International Conference on Acoustics, Speech and Signal Processing, ICASSP 2020, Barcelona, Spain, May 4-8, 2020},
  publisher = {IEEE},
  isbn = {978-1-5090-6631-5},
}