Analysis of Passive Memristive Devices Array: Data-Dependent Statistical Model and Self-Adaptable Sense Resistance for RRAMs

Sangho Shin, Kyungmin Kim, Sung-Mo Kang. Analysis of Passive Memristive Devices Array: Data-Dependent Statistical Model and Self-Adaptable Sense Resistance for RRAMs. Proceedings of the IEEE, 100(6):2021-2032, 2012. [doi]

@article{ShinKK12,
  title = {Analysis of Passive Memristive Devices Array: Data-Dependent Statistical Model and Self-Adaptable Sense Resistance for RRAMs},
  author = {Sangho Shin and Kyungmin Kim and Sung-Mo Kang},
  year = {2012},
  doi = {10.1109/JPROC.2011.2165690},
  url = {http://dx.doi.org/10.1109/JPROC.2011.2165690},
  researchr = {https://researchr.org/publication/ShinKK12},
  cites = {0},
  citedby = {0},
  journal = {Proceedings of the IEEE},
  volume = {100},
  number = {6},
  pages = {2021-2032},
}