Jongchul Shin, Hyunjin Kim, Sungho Kang. At-Speed Boundary-Scan Interconnect Testing in a Board with Multiple System Clocks. In 1999 Design, Automation and Test in Europe (DATE 99), 9-12 March 1999, Munich, Germany. pages 473, IEEE Computer Society, 1999. [doi]
@inproceedings{ShinKK99,
title = {At-Speed Boundary-Scan Interconnect Testing in a Board with Multiple System Clocks},
author = {Jongchul Shin and Hyunjin Kim and Sungho Kang},
year = {1999},
url = {http://csdl.computer.org/comp/proceedings/date/1999/0078/00/00780473abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/ShinKK99},
cites = {0},
citedby = {0},
pages = {473},
booktitle = {1999 Design, Automation and Test in Europe (DATE 99), 9-12 March 1999, Munich, Germany},
publisher = {IEEE Computer Society},
isbn = {0-7695-0078-1},
}