Yong-Goo Shin, Dae-Hong Lee, Mun-Cheon Kang, Jeisung Lee, Sung Jea Ko. A novel burn-in potential region detection method using image processing technique. In IEEE International Conference on Consumer Electronics, ICCE 2017, Las Vegas, NV, USA, January 8-10, 2017. pages 215-216, IEEE, 2017. [doi]
Abstract is missing.