Seung-Hun Shin, Seung-Kyu Park, Kyung-Hee Choi, Ki-Hyun Jung. Normalized Adaptive Random Test for Integration Tests. In Workshop Proceedings of the 34th Annual IEEE International Computer Software and Applications Conference, COMPSAC Workshops 2010, Seoul, Korea, 19-23 July 2010. pages 335-340, IEEE Computer Society, 2010. [doi]
Abstract is missing.