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Adaptive ECC for Tailored Protection of Nanoscale Memory

Dongyeob Shin, Jongsun Park, Jangwon Park, Somnath Paul, Swarup Bhunia. Adaptive ECC for Tailored Protection of Nanoscale Memory. IEEE Design & Test of Computers, 34(6):84-93, 2017. [doi]

Authors

Dongyeob Shin

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Jongsun Park

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Jangwon Park

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Somnath Paul

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Swarup Bhunia

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