Statistical Characterization of Chemical Noise in MALDI TOF MS by Wavelet Analysis of Multiple Noise Realizations

Hyunjin Shin, Mehul P. Sampat, Sheldon F. Bish, John Koomen, Mia K. Markey. Statistical Characterization of Chemical Noise in MALDI TOF MS by Wavelet Analysis of Multiple Noise Realizations. In AMIA 2006, American Medical Informatics Association Annual Symposium, Washington, DC, USA, November 11-15, 2006. AMIA, 2006. [doi]

Abstract

Abstract is missing.