Jun-Sik Shin, Muhammad Usman, JongWon Kim. Conceptual Verification of Multi-Level Visibility Points for SmartX MultiView Security. In International Conference on Information and Communication Technology Convergence, ICTC 2018, Jeju Island, Korea (South), October 17-19, 2018. pages 1449-1451, IEEE, 2018. [doi]
Abstract is missing.