Kenichi Shinkai, Masanori Hashimoto, Takao Onoye. A gate-delay model focusing on current fluctuation over wide range of process-voltage-temperature variations. Integration, 46(4):345-358, 2013. [doi]
@article{ShinkaiHO13,
title = {A gate-delay model focusing on current fluctuation over wide range of process-voltage-temperature variations},
author = {Kenichi Shinkai and Masanori Hashimoto and Takao Onoye},
year = {2013},
doi = {10.1016/j.vlsi.2013.01.003},
url = {http://dx.doi.org/10.1016/j.vlsi.2013.01.003},
researchr = {https://researchr.org/publication/ShinkaiHO13},
cites = {0},
citedby = {0},
journal = {Integration},
volume = {46},
number = {4},
pages = {345-358},
}