Binary Classification from Positive Data with Skewed Confidence

Kazuhiko Shinoda, Hirotaka Kaji, Masashi Sugiyama. Binary Classification from Positive Data with Skewed Confidence. In Christian Bessiere, editor, Proceedings of the Twenty-Ninth International Joint Conference on Artificial Intelligence, IJCAI 2020 [scheduled for July 2020, Yokohama, Japan, postponed due to the Corona pandemic]. pages 3328-3334, ijcai.org, 2020. [doi]

Abstract

Abstract is missing.