Analytical Model of Static Noise Margin in CMOS SRAM for Variation Consideration

Hirofumi Shinohara, Koji Nii, Hidetoshi Onodera. Analytical Model of Static Noise Margin in CMOS SRAM for Variation Consideration. IEICE Transactions, 91-C(9):1488-1500, 2008. [doi]

Abstract

Abstract is missing.