Masato Shiozaki, Takashi Sato. Characteristic Degradation of Power MOSFETs by X-Ray Irradiation and Their Recovery. In IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022. pages 64-1, IEEE, 2022. [doi]
@inproceedings{ShiozakiS22,
title = {Characteristic Degradation of Power MOSFETs by X-Ray Irradiation and Their Recovery},
author = {Masato Shiozaki and Takashi Sato},
year = {2022},
doi = {10.1109/IRPS48227.2022.9764536},
url = {https://doi.org/10.1109/IRPS48227.2022.9764536},
researchr = {https://researchr.org/publication/ShiozakiS22},
cites = {0},
citedby = {0},
pages = {64},
booktitle = {IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022},
publisher = {IEEE},
isbn = {978-1-6654-7950-9},
}