Shino Shiraki, Yuto Ohashi, Takuhiro Uehara, Shigeo Shioda. Verification of Error-Increasing Factors by Sensor Response-Based Localization Technology Through Real Device Experiments. IEEE Access, 9:101729-101740, 2021. [doi]
@article{ShirakiOUS21,
title = {Verification of Error-Increasing Factors by Sensor Response-Based Localization Technology Through Real Device Experiments},
author = {Shino Shiraki and Yuto Ohashi and Takuhiro Uehara and Shigeo Shioda},
year = {2021},
doi = {10.1109/ACCESS.2021.3095306},
url = {https://doi.org/10.1109/ACCESS.2021.3095306},
researchr = {https://researchr.org/publication/ShirakiOUS21},
cites = {0},
citedby = {0},
journal = {IEEE Access},
volume = {9},
pages = {101729-101740},
}