Verification of Error-Increasing Factors by Sensor Response-Based Localization Technology Through Real Device Experiments

Shino Shiraki, Yuto Ohashi, Takuhiro Uehara, Shigeo Shioda. Verification of Error-Increasing Factors by Sensor Response-Based Localization Technology Through Real Device Experiments. IEEE Access, 9:101729-101740, 2021. [doi]

Abstract

Abstract is missing.