Majid Shirazi, Markus Schmitz, Simon Janssen, Anabelle Thies, Georgij Safronov, Amr Rizk, Peter Mayr, Philipp Engelhardt. Verifying the Applicability of Synthetic Image Generation for Object Detection in Industrial Quality Inspection. In M. Arif Wani, Ishwar K. Sethi, Weisong Shi, Guangzhi Qu, Daniela Stan Raicu, Ruoming Jin, editors, 20th IEEE International Conference on Machine Learning and Applications, ICMLA 2021, Pasadena, CA, USA, December 13-16, 2021. pages 1365-1372, IEEE, 2021. [doi]
Abstract is missing.