Philip P. Shirvani, Edward J. McCluskey. PADded Cache: A New Fault-Tolerance Technique for Cache Memories. In 17th IEEE VLSI Test Symposium (VTS 99), 25-30 April 1999, San Diego, CA, USA. pages 440-445, IEEE Computer Society, 1999. [doi]
@inproceedings{ShirvaniM99,
title = {PADded Cache: A New Fault-Tolerance Technique for Cache Memories},
author = {Philip P. Shirvani and Edward J. McCluskey},
year = {1999},
url = {http://csdl.computer.org/comp/proceedings/vts/1999/0146/00/01460440abs.htm},
tags = {caching},
researchr = {https://researchr.org/publication/ShirvaniM99},
cites = {0},
citedby = {0},
pages = {440-445},
booktitle = {17th IEEE VLSI Test Symposium (VTS 99), 25-30 April 1999, San Diego, CA, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-0146-X},
}