A novel radiation tolerant SRAM design based on synergetic functional component separation for nanoscale CMOS

Yuriy Shiyanovskii, Aravind Rajendran, Christos A. Papachristou. A novel radiation tolerant SRAM design based on synergetic functional component separation for nanoscale CMOS. In 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece. pages 139-144, IEEE, 2011. [doi]

@inproceedings{ShiyanovskiiRP11,
  title = {A novel radiation tolerant SRAM design based on synergetic functional component separation for nanoscale CMOS},
  author = {Yuriy Shiyanovskii and Aravind Rajendran and Christos A. Papachristou},
  year = {2011},
  doi = {10.1109/IOLTS.2011.5993827},
  url = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2011.5993827},
  tags = {design},
  researchr = {https://researchr.org/publication/ShiyanovskiiRP11},
  cites = {0},
  citedby = {0},
  pages = {139-144},
  booktitle = {17th IEEE International On-Line Testing Symposium (IOLTS 2011), 13-15 July, 2011, Athens, Greece},
  publisher = {IEEE},
  isbn = {978-1-4577-1053-7},
}