Process reliability based trojans through NBTI and HCI effects

Yuriy Shiyanovskii, Francis G. Wolff, Aravind Rajendran, Christos A. Papachristou, Daniel J. Weyer, W. Clay. Process reliability based trojans through NBTI and HCI effects. In Tughrul Arslan, Didier Keymeulen, David Merodio, Khaled Benkrid, Ahmet T. Erdogan, Umeshkumar D. Patel, editors, 2010 NASA/ESA Conference on Adaptive Hardware and Systems, AHS 2010, Anaheim, California, USA, June 15-18, 2010. pages 215-222, IEEE, 2010. [doi]

Abstract

Abstract is missing.