Lee A. Shombert, John W. Sheppard. A Behavior Model for Next Generation Test Systems. J. Electronic Testing, 13(3):299-314, 1998. [doi]
@article{ShombertS98,
title = {A Behavior Model for Next Generation Test Systems},
author = {Lee A. Shombert and John W. Sheppard},
year = {1998},
doi = {10.1023/A:1008337903968},
url = {http://dx.doi.org/10.1023/A:1008337903968},
tags = {testing},
researchr = {https://researchr.org/publication/ShombertS98},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {13},
number = {3},
pages = {299-314},
}